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The Electro-optical sampling delay scanning technique can be used for electron beam bunch length measurement. A novel non-ynchronous delay scanning technique based on the electro-optical sampling meas...
RF deflectors can be used for bunch length measurement with high resolution. This paper describes a completed S-band traveling wave RF deflector and the bunch length measurement of the electron beam p...
Based on the femtosecond accelerator device which was built at the Shanghai Institute of Applied Physics (SINAP), recently a modified far infrared Michelson interferometer has been developed to measur...
RF deflecting cavity can be used for bunch length measurement and is designed to diagnose the beam produced by the photocathode electron gun which was built at Tsinghua University for the Thomson scat...

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