搜索结果: 1-1 共查到“电子科学与技术 Titanium Silicide”相关记录1条 . 查询时间(0.072 秒)
Titanium Silicide Formation in Presence of Oxygen
Titanium Silicide rf Sputtering Resistivity vs. Temperature Rutherford Backscattering Spectrometry Auger Spectroscopy X-Ray Diffraction
1991/11/18
In-situ resistivity vs. temperature, Rutherford backscattering spectrometry, Auger electron spectroscopy and X-ray diffraction measurements have been performed in order to study the effects arising fr...