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A New Junction Parameters Determination Using the Double Exponential Model
Characteristic Junction Parameters Extraction Modeling
2001/12/3
A double exponential model is used to characterize the junction properties of microelectronic devices. A method is developed to extract the physical junction parameters from the current-voltage charac...
Insufficiencies of the Single Exponential Model and Efficiency of the Double Exponential Model in the Optimization of Solar Cells Efficiency
Single exponential model double exponential model optimization solar cells efficiency restrictive parameters
1998/9/4
Single and double exponential models are confronted to determine the most adapted model for optimization of solar cells efficiency. It is shown that the single exponential model (SEM) presents some in...