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With the dramatic growth in electronic circuitry applications, more demands are being placed on those systems’ integrity and reliability. More circuits require use of higher frequencies and smaller s...
A low frequency noise and charge carriers transport mechanism analysis was performed on tantalum capacitors in order to characterise their quality and reliability. The model of TaTa2O5−Mn...
Noise has been measured in a number of biased solid tantalum capacitors at frequencies down to 0.01 Hz. The noise current was found to have a 1/f power spectrum, and the amplitude varied with the bias...
The electrical characteristics of anodic oxide films formed on tantalum are investigated in anodes oxidized in the standard electrolytes for low-voltage (0.01% H3PO4 in water) and high-voltage (same p...

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